发明名称 |
NON-VOLATILE MEMORY AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A non-volatile memory and a method for fabricating the same are provided to lower a voltage applied to an erasing gate by using a vector sum of a bit line and an erasing gate. CONSTITUTION: An isolation layer(32) is formed in a predetermined interval on a semiconductor substrate(31). A bit line(33) is formed on the semiconductor substrate(31) including the isolation layer(32). The bit line(33) is located on a multitude of line of a vertical direction of the isolation layer(32). A buried n+ layer(35) for bit line is buried into the semiconductor substrate(31) between the isolation layers(32). The buried n+ layer(35) for bit line is contacted with a lower side of the bit line(33). A floating gate(36) is formed by inserting a gate oxide layer(34) into one side between the isolation layers(32). A control gate(38) is formed by inserting an interlayer dielectric(37) into an upper side of the floating gate(36). An erasing gate(41) is formed by inserting a gap gate oxide layer(39) and the second insulating layer sidewall on upper sides of the control gate(38) and the floating gate(36).
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申请公布号 |
KR100294693(B1) |
申请公布日期 |
2001.04.19 |
申请号 |
KR19980004637 |
申请日期 |
1998.02.16 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KIM, DONG SEON |
分类号 |
H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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