发明名称 Gate electrode formation method
摘要 A method for forming a gate electrode. In one embodiment, the present invention comprises depositing a gate metal over an underlying substrate such that a layer of the gate metal is formed above the underlying substrate. In the present invention, the layer of the gate metal is deposited to a thickness approximately the same as the thickness desired for the gate electrode. Next, the present invention deposits polymer particles onto the layer of gate metal. A hard mask layer is then deposited over the polymer particles and the layer of the gate metal. The present invention removes the polymer particles and portions of the hard mask layer which overlie the polymer particles such that first regions of the layer of the gate metal are exposed, and such that second regions of the layer of the gate metal remain covered by the hard mask layer. After the removal step, the present invention etches through the first regions of the layer of the gate metal such that openings are formed completely through the layer of the gate metal at the first regions. After the openings have been formed, the remaining portions of the hard mask layer which overlie the second regions of the layer of the gate metal are removed.
申请公布号 US6217403(B1) 申请公布日期 2001.04.17
申请号 US19990425835 申请日期 1999.10.21
申请人 CANDESCENT TECHNOLOGIES CORPORATION 发明人 CHAKRAVORTY KISHORE K.;ELIZONDO PHILIP J.
分类号 H01J9/02;(IPC1-7):H01J9/02 主分类号 H01J9/02
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