发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY AND ITS MANUFACTURING METHOD |
摘要 |
PURPOSE: Provided is a nonvolatile semiconductor memory which enables microminiaturization of a memory cell without causing gate-to-gate short circuit failure and deteriorating isolation performance by restraining dispersion of capacitive coupling of a lamination gate. CONSTITUTION: An element formation region(3) defined by an elements isolation film(2) is formed in a silicon substrate(1). A charge storage layer(5) is formed in the substrate(1) interposing a tunnel insulation film(4), a control gate(8) is formed interposing a gate insulation film(7) thereon, and a memory cell is constituted in this way. The charge storage layer(5) of a memory cell is subjected to pattern formation to overlap partially ranging from an element formation region(3) to the element isolation film(2). A protection insulation film(11) which protects a surface of the element isolation film(2) is arranged between end parts of the charge storage layer(5) of opposite adjacent memory cells on the element isolation film(2).
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申请公布号 |
KR20010030188(A) |
申请公布日期 |
2001.04.16 |
申请号 |
KR20000051025 |
申请日期 |
2000.08.31 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
SHIMIZU KAZUHIRO;TAKEUCHI YUJI |
分类号 |
H01L21/8247;H01L27/115;(IPC1-7):H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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