发明名称 NONVOLATILE SEMICONDUCTOR MEMORY AND ITS MANUFACTURING METHOD
摘要 PURPOSE: Provided is a nonvolatile semiconductor memory which enables microminiaturization of a memory cell without causing gate-to-gate short circuit failure and deteriorating isolation performance by restraining dispersion of capacitive coupling of a lamination gate. CONSTITUTION: An element formation region(3) defined by an elements isolation film(2) is formed in a silicon substrate(1). A charge storage layer(5) is formed in the substrate(1) interposing a tunnel insulation film(4), a control gate(8) is formed interposing a gate insulation film(7) thereon, and a memory cell is constituted in this way. The charge storage layer(5) of a memory cell is subjected to pattern formation to overlap partially ranging from an element formation region(3) to the element isolation film(2). A protection insulation film(11) which protects a surface of the element isolation film(2) is arranged between end parts of the charge storage layer(5) of opposite adjacent memory cells on the element isolation film(2).
申请公布号 KR20010030188(A) 申请公布日期 2001.04.16
申请号 KR20000051025 申请日期 2000.08.31
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SHIMIZU KAZUHIRO;TAKEUCHI YUJI
分类号 H01L21/8247;H01L27/115;(IPC1-7):H01L27/115 主分类号 H01L21/8247
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