发明名称 MEASURING APPARATUS AND MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To automatically adjust at high speed the relative position between an indicated waveform and a mask to avoid collision of the waveform within rating against the mask. SOLUTION: A take-in circuit 110 takes in a plurality of samples of a waveform, a controller 130 generates mask pixel data defining a mask, a raster memory 150 stores the samples of waveform and the mask pixel data, a rasterizer 140 reads the stored content of the master memory to judge in approximately real time if the samples of waveform are written on memory areas for the mask pixel data, and if the waveform collides against the mask according to this judgement, it generates a collision signal.
申请公布号 JP2001099869(A) 申请公布日期 2001.04.13
申请号 JP20000250189 申请日期 2000.08.21
申请人 TEKTRONIX INC 发明人 LETTS PETER J
分类号 G01R13/20;G01R13/30;G01R13/34;G01R31/28;H04B17/00;H04L1/24;H04M3/00;H04M3/30;(IPC1-7):G01R13/20 主分类号 G01R13/20
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