发明名称 SEMICONDUCTOR MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a DRAM with reduced bit line interference noises, having a cell array of an open bit-line system. SOLUTION: This cell array of an open bit-line system has an SGT cell structure. A memory cell is formed in each intersection of word lines 14 and bit lines 16. Each memory cell along a bit line is regarded as an NMOS cell MN which uses an NMOS transistor as its transfer gate and each memory cell along another bit line adjacent to the bit line is regarded as a PMOS cell MP, which use a PMOS transistor as its transfer gate.
申请公布号 JP2001102549(A) 申请公布日期 2001.04.13
申请号 JP20000258213 申请日期 2000.08.28
申请人 TOSHIBA CORP 发明人 WATANABE SHIGEYOSHI;TSUCHIDA KENJI;WATANABE YOJI;YAMADA TAKASHI
分类号 G11C11/401;G11C11/404;H01L21/8242;H01L27/108 主分类号 G11C11/401
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