发明名称 METHOD AND DEVICE FOR COLLECTING IMPURITY
摘要 PROBLEM TO BE SOLVED: To sufficiently and carefully prevent accidents, such as falling and the reduction of working efficiency caused by installing a wafer for collecting impurities in a vertical direction for collection work. SOLUTION: The device is equipped with a wafer retention part 5 that retains a wafer 4 horizontally, a collection liquid retention part 1 that retains impuirity collection liquid 3 at a groove part 2 by surface tension, and a control part that controls the position of the collection liquid retention part 1 by using a position adjustment thumb, so that the end of the water 4 being retained by the wafer retention part 5 is positioned in the groove 2 of the collection liquid retention part 1.
申请公布号 JP2001102341(A) 申请公布日期 2001.04.13
申请号 JP19990273912 申请日期 1999.09.28
申请人 SHARP CORP 发明人 TAKASUKA MASAMI;MUKAI TOSHIO
分类号 H01L21/304;(IPC1-7):H01L21/304 主分类号 H01L21/304
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