发明名称 Circuit for determining latency of buffer circuit generates latency interval and latency indication from clock signal and from test signal derived from clock signal with delay
摘要 The circuit has a latency interval definition stage (20) that receives a clock signal (CLK) and generates at least one latency interval definition signal that defines at least one latency interval. A latency indication stage (30) receives the definition signal(s) and a test signal (Del2) delayed relative to the clock signal by a defined time and generates a latency indication from them. The test signal is derived from the clock signal. Independent claims are also included for the following: a variable latency buffer circuit, a memory component and a method of determining latency.
申请公布号 DE10049029(A1) 申请公布日期 2001.04.12
申请号 DE20001049029 申请日期 2000.10.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHUNG, DAE-HYUN
分类号 G11C11/407;G01R31/30;G11C7/10;G11C7/22;G11C11/401;(IPC1-7):G11C7/20;G11C11/409 主分类号 G11C11/407
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