发明名称 |
Circuit for determining latency of buffer circuit generates latency interval and latency indication from clock signal and from test signal derived from clock signal with delay |
摘要 |
The circuit has a latency interval definition stage (20) that receives a clock signal (CLK) and generates at least one latency interval definition signal that defines at least one latency interval. A latency indication stage (30) receives the definition signal(s) and a test signal (Del2) delayed relative to the clock signal by a defined time and generates a latency indication from them. The test signal is derived from the clock signal. Independent claims are also included for the following: a variable latency buffer circuit, a memory component and a method of determining latency.
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申请公布号 |
DE10049029(A1) |
申请公布日期 |
2001.04.12 |
申请号 |
DE20001049029 |
申请日期 |
2000.10.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHUNG, DAE-HYUN |
分类号 |
G11C11/407;G01R31/30;G11C7/10;G11C7/22;G11C11/401;(IPC1-7):G11C7/20;G11C11/409 |
主分类号 |
G11C11/407 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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