发明名称 Method of forming a semiconductor device using an excimer laser to selectively form the gate insulator
摘要 To form a high-quality insulating layer at a low temperature, a semiconductor layer is formed on an insulating surface of an insulating substrate, and the semiconductor layer is selectively modified by an excimer laser irradiated from a surface opposing the insulating surface side of the semiconductor layer to form an insulating layer.
申请公布号 US6214684(B1) 申请公布日期 2001.04.10
申请号 US19960720236 申请日期 1996.09.26
申请人 CANON KABUSHIKI KAISHA 发明人 SHOJI TATSUMI
分类号 H01L21/20;H01L21/268;H01L21/318;H01L21/3215;H01L21/336;H01L21/77;H01L21/84;H01L27/144;H01L29/49;H01L29/786;H01L31/113;(IPC1-7):H01L21/336 主分类号 H01L21/20
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