发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method by which voids can be formed under a T-shaped gate electrode even when a high-quality insulating film forming method is used and a semiconductor device provided with the T-type gate electrode. SOLUTION: A semiconductor device is provided with source and drain areas 110 and 111 formed in a semiconductor substrate, a channel area formed between the areas 110 and 111, and gate electrodes 102 and 103 which are formed on the channel area and having eaves sections 106 in the directions in which the distances from the channel area become longer. The device is also provided with projecting sections 104 formed between the eaves sections 106 and substrate and an insulating film 105 which is formed to leave voids 107 between the eaves sections 106 and substrate.
申请公布号 JP2001093912(A) 申请公布日期 2001.04.06
申请号 JP19990269766 申请日期 1999.09.24
申请人 TOSHIBA CORP 发明人 AMANO MINORU;SUGIURA MASAYUKI
分类号 H01L29/812;H01L21/338;(IPC1-7):H01L21/338 主分类号 H01L29/812
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