| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem that the conventional IC test clip could be hardly used for downsized surface mount boards or when no sufficient IC top space could be taken, or its working efficiency was extremely lowered. SOLUTION: The parallel IC terminal connection test clip capable of connecting a plurality of probes to a plurality of parallel disposed IC terminals comprises a plural-probe cooperation suppressor for suppressing a motion for driving the plurality of probes to make a uniform motion all together, a plural- probe cooperative rotation controller for driving the plurality of probes to make a uniform rotation all together, an electric connection hold stress part for continuing giving a stress for holding electric connection with each IC terminal pinched by the tops of the probes, and an inter-probe relative center of gravity unchanging suppressor for suppressing the position changing of the relative center of gravity among the plurality of probes.
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