| 摘要 |
PROBLEM TO BE SOLVED: To provide an LSI in which function test can be carried out at the actual working speed of a function block in the LSI using built-in memories. SOLUTION: At the time of testing an objective inner logic circuit 100, the test vector thereof is written in built-in memories 2, 3 from the outside of an LSI 200 and applied to the objective inner logic circuit 100 according to an address generated from an address generating circuit 4. Output data from the objective inner logic circuit 100 is stored in the built-in memories 2, 3 according to an address generated from an address generating circuit 4 and then read out to the outside of the LSI 200 thus testing the objective inner logic circuit 100.
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