发明名称 METHOD AND APPARATUS FOR TESTING ELECTROSTATIC BREAKDOWN OF ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To realize an electrostatic breakdown test of an electronic device which can raise the measurement reliability of the breakdown resistance of the electronic device against the electrostatic discharge. SOLUTION: A sample device 200 is settled on a charging plate 110 and contacted at one end 201e to a contact needle 101. A grounded switch SW2 connected to the contact needle 101 is set on for a specified time to remove charges from the sample device 200 and a grounded switch SW3 is set on for a specified time to remove charges from the charging plate 110 through a high resistance 21. After completing the charge removal, a high voltage from a high voltage source E is applied through the high resistance 21 to the sample device 200 to induce and take unipolar charges on the sample device 200, and then the switch SW2 is set on to discharge the unipolar charges stored on the sample device 200.
申请公布号 JP2001091572(A) 申请公布日期 2001.04.06
申请号 JP19990266953 申请日期 1999.09.21
申请人 TOKYO DENSHI KOEKI KK 发明人 SUGIURA TSUNEO;KOIKE SHIRO;HONDA MASAMI
分类号 G01R31/30;G01R31/26;(IPC1-7):G01R31/26 主分类号 G01R31/30
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