发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to form a uniform dielectric layer on a storage electrode by performing an annealing process in an oxygen atmosphere in manufacturing the capacitor of a metal-insulator-metal(MIM) structure. CONSTITUTION: A lower electrode(100) is formed on a semiconductor substrate by using a conductive layer containing an aluminum element, a nitrogen element and another metal element other than the aluminum element. The lower electrode is annealed in an oxygen atmosphere to form an aluminum oxide layer(210) on the lower electrode by firstly using oxidation of the aluminum element contained in the conductive layer. A plate electrode is formed on the dielectric layer.
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申请公布号 |
KR20010028836(A) |
申请公布日期 |
2001.04.06 |
申请号 |
KR19990041311 |
申请日期 |
1999.09.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
WON, SEOK JUN;YOO, CHA YEONG |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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