A method and apparatus for testing supply connections

摘要

The invention presents an apparatus and method for testing supply connections (80) of an electronic device (10) by using a current mirror (20) configuration through using a particular connection of the branches of the current mirror to the supply line. Such connection results in unbalanced operation of the current mirror but depending whether said supply connection under test is proper or not, said unbalance is essentially different, resulting in a high sensitivity of the invented test device. <IMAGE>