发明名称 Integrated circuit air bridge structures and methods of fabricating same
摘要 Conductive elements which provide interconnections (air bridges between circuits) and components such as capacitors and inductors may be incorporated in the devices in a manner to reduce parasitic effects in the operation of the devices while providing close spacing which enhances the performance of the devices at high frequency. Separate substrates are provided respectively having the integrated circuits formed therein and covering, preferably sealing the integrated circuits. The air bridge conductive components (interconnections, capacitors or inductors) are formed separately in the covering substrate which is assembled with the substrate having the integrated circuit as a lid which seals and packages the circuits and the conductive element or component contained in the lid. The conductive component may be separated by cavities formed in the lid substrate or in the substrate having the integrated circuit device already formed therein. Assembly may take place at temperatures lower than necessary for fusion bonding and diffusion commonly used in the fabrication of integrated circuits. Bonds which are used may be metal, oxide or plastic (polymer) bonding material.
申请公布号 US6211056(B1) 申请公布日期 2001.04.03
申请号 US19980199292 申请日期 1998.11.24
申请人 INTERSIL CORPORATION 发明人 BEGLEY PATRICK A.;YOUNG WILLIAM R.;RIVOLI ANTHONY L.;DELGADO JOSE AVELINO;GAUL STEPHEN J.
分类号 H01L21/302;H01L21/02;H01L21/3065;H01L21/768;H01L21/822;H01L23/522;H01L27/04;(IPC1-7):H01L21/476 主分类号 H01L21/302
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