发明名称 EVEN BALANCE
摘要 PROBLEM TO BE SOLVED: To reduce error due to biased-placement load without being accompanied by reduction in the measurement sensitivity. SOLUTION: Of upper and lower beam members 11, 12, the number of beams in the lower beam member 12 near a connection elastic fulcrum 51 is 2, namely one more than the number of beams, 1, in the upper beam member 11. The lower beam member 12 has higher rigidity, and, even if biased-placement load is applied to a sample plate 20, the connection elastic fulcrum 51 is suppressed to move back and forth (horizontally). Increase of bent rigidity of the upper beam member 11 is minimized, and reduction of the sensitivity is suppressed in a measurement performed by bending the upper and lower beam members 11, 12.
申请公布号 JP2001074539(A) 申请公布日期 2001.03.23
申请号 JP19990246360 申请日期 1999.08.31
申请人 SHIMADZU CORP 发明人 KAWAMOTO AKIRA
分类号 G01G7/04;G01G21/24;G01G23/01;(IPC1-7):G01G7/04 主分类号 G01G7/04
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