发明名称 PROCESS CHAMBER OF LOW PRESSURE CHEMICAL VAPOR DEPOSITION DEVICE
摘要 PURPOSE: A process chamber of a low pressure chemical vapor deposition device is provided to have two ground lines of high frequency side, fill up insufficient capacitance of a ground line, prevent overload of a low frequency side ground line, and prevent a ground line from breaking. CONSTITUTION: A process chamber of low pressure chemical vapor deposition chamber diffuses a gas and chemical on a wafer of high temperature heater block through a shower head(106) in a vacuum state, makes a plasma state by RF generator(107), and forms a film. A ground line(18) is additionally mounted to a high frequency side in the process chamber. Thereby, the process chamber fills up insufficient capacitance of the ground line(18), prevents overload of a low frequency side ground line, and prevents a ground line from breaking.
申请公布号 KR20000025671(A) 申请公布日期 2000.05.06
申请号 KR19980042831 申请日期 1998.10.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, JUN OH
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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