发明名称 Production of epitaxial layer for dynamic random access memory comprises preparing substrate having single crystalline and insulated regions, growing epitaxial layer on single crystalline region and partially removing epitaxial layer
摘要 Production of an epitaxial layer comprises: preparing substrate (105) having a single crystalline region (107) and an electrically insulated region (108); growing epitaxial layer (245) on the single crystalline region; and partially removing the epitaxial layer. Production of an epitaxial layer comprises: preparing substrate (105) having a single crystalline region (107) and an electrically insulated region (108); growing epitaxial layer (245) on the single crystalline region, in which the electrically insulated region is partially grown laterally by the epitaxial layer and forms an epitaxial closing joint (275); and partially removing the epitaxial layer above the electrically insulated region so that the epitaxial closing joint is partially removed. Preferred Features: The epitaxial layer is removed by anisotropic etching. The single crystalline region consists of silicon and the electrically insulated region consists of silicon oxide.
申请公布号 DE19941147(A1) 申请公布日期 2001.03.22
申请号 DE1999141147 申请日期 1999.08.30
申请人 INFINEON TECHNOLOGIES AG 发明人 TEMMLER, DIETMAR;BENZINGER, HERBERT;KARCHER, WOLFRAM;PUSCH, CATHARINA;SCHREMS, MARTIN;FAUL, JUERGEN
分类号 H01L21/20;H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/20
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