| 摘要 |
PROBLEM TO BE SOLVED: To accurately judge the time of replacement of a polymer-covered apparatus by detecting the degree of deterioration of a polymer covering in its mounted state. SOLUTION: In a polymer-covered apparatus, such as a polymer insulator, made up by providing a covering shade 1 of silicone rubber on a surface of an FRP core 2, a semiconductor silicon pn diode 3 of a bare chip shape is embedded within the covering shade 1. Desirably, the diode has a structure in which p-n junction parts 6 are separated by a multiplicity of grooves 7 made deep in a step-wise manner, from end parts of the element toward the center and the interior of the grooves 7 is filled with silicone rubber.
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