| 摘要 |
A shift register (30) or other electronic drive circuit (20, 30) for an LCD or other active matrix device (10) includes a series of circuit blocks (30A, 30B, etc) each having redundancy in the form of parallel circuit paths (31 and 32). When the circuit is turned on, self-testing and redundancy selection is carried out by individual test and control arrangements (34) which are associated with the blocks (30A, 30B, etc). The test and control arrangements (34) may comprise memory elements, such as a bistable, which electrically programme themselves in response to their electrical testing of the paths so as to generate a control signal at an output coupled to one or more switches (33). The switches (33) control which of the parallel circuit paths provides an output (23) to the active matrix device (10). Each test and control arrangement (34) also comprises a routing circuit controlled by the control signal, for transmitting the correct serial output of that block to all serial input of next block. <IMAGE> |
