发明名称 |
Self aligned contact pad in a semiconductor device and method for forming the same |
摘要 |
Self-aligned contact pads in a semiconductor device and a method for forming the same are provided. These self-aligned contact pads can increase the upper surface of the contact pads to increase alignment margins. Portions of the gate mask are undercut, increasing the spaces between the gate structures. As a result, contact pads that are filled in these spaces have an increased upper surface contacting an electrical contact.
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申请公布号 |
US6204161(B1) |
申请公布日期 |
2001.03.20 |
申请号 |
US19990418595 |
申请日期 |
1999.10.15 |
申请人 |
SAMSUNG ELECTRONICS, CO., LTD. |
发明人 |
CHUNG TAE-YOUNG;LEE JAE-GOO;CHO CHANG-HYUN |
分类号 |
H01L21/28;H01L21/60;H01L21/768;H01L21/8242;H01L23/485;(IPC1-7):H01L21/336;H01L21/44 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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