发明名称 |
APPARATUS AND METHOD FOR ETCHING SILICON SUBSTRATE HAVING FORMED CIRCUIT PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and a method for etching a Si substrate already having a formed circuit pattern whereby the strength of the Si substrate can be raised by removing a microcrack introducing layer from the Si substrate after mechanical-chemical polishing. SOLUTION: Substrates 7 are held back to back with counterposed upper and lower electrodes 6, 3 and a plasma discharge is caused between first and second electrodes under the condition that the product PL of the distance L (m) between the upper and lower electrodes 6, 3 and the pressure P (Pa) of a plasma generating mixed gas contg. O and a fluoric gas to be fed into a process chamber 5 ranges 2.5-15 (Pa.m). Thus it is possible to improve the strength of the Si substrate by efficiently removing a microcrack introducing layer on the back side of the substrate 7.
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申请公布号 |
JP2001068452(A) |
申请公布日期 |
2001.03.16 |
申请号 |
JP19990239338 |
申请日期 |
1999.08.26 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HAJI HIROSHI;ARITA KIYOSHI |
分类号 |
H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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