发明名称 BUS SYSTEM AND INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To prevent the occurrence of malfunctions and to improve reliability by providing a capacitor between the drain of a first field effect transistor(FET) and the gate of a second FET. SOLUTION: A differential noise obtained by inverting a differential noise inputted to the gate of an nMOS transistor 73 appears in the drain of the nMOS transistor 73, but this differential noise can be transmitted through a capacitor 145 to the gate of an nMOS transistor 74 as shown by an arrow 147. As a result, a noise to be mixed into a reference voltage system as a broken line 146 can be canceled by the differential noise transmitted through the capacitor 145 to the gate of the nMOS transistor 74. Thus, the malfunction caused by noises inputted to input circuits 57-61 when all the output of output circuits 77-81 are in high impedance states can be prevented, power consumption can be reduced and an output waveform can be optimized.
申请公布号 JP2001068990(A) 申请公布日期 2001.03.16
申请号 JP20000230295 申请日期 2000.07.31
申请人 FUJITSU LTD 发明人 TAGUCHI MASAO
分类号 H03K5/08;G11C11/401;G11C11/407;G11C11/409;H03F3/45;H03K5/1252;H03K19/0175 主分类号 H03K5/08
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