发明名称 Method of manufacturing multi-layer metal capacitor
摘要 A method for manufacturing a capacitor includes the steps of forming a dielectric layer over a substrate, and then forming at least one contact within the dielectric layer. Next, a first metal layer is formed on the dielectric layer and an electromigration layer is formed on the first metal layer. A patterned capacitor dielectric layer is formed on the electromigration layer in a capacitor area. A second metal layer is then formed over the substrate and defined; a portion of second metal serving as an upper electrode of the capacitor is therefore formed on the electromigration layer. A portion of the second metal layer on the contact serves as a portion of the via of the interconnects. The electromigration layer is self-alignedly patterned when patterning the second metal layer, and a portion of the electromigration layer serves as a lower electrode of the capacitor. The electromigration layer on the contact in the via area is used to prevent electromigration.
申请公布号 US6200629(B1) 申请公布日期 2001.03.13
申请号 US19990228186 申请日期 1999.01.12
申请人 UNITED MICROELECTRONICS CORP. 发明人 SUN SHIH-WEI
分类号 H01L21/02;H01L21/60;H01L27/08;(IPC1-7):B05D5/12 主分类号 H01L21/02
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