发明名称 Semiconductor memory device having a plurality of transfer gates and improved word line and column select timing for high speed write operations
摘要 A semiconductor memory device which receives a row address strobe (RAS) signal and a column address strobe (CAS) signal from an external device. The device includes rewritable memory cells formed on a semiconductor substrate, a plurality of bit lines, a plurality of word lines, and a transfer gate coupled between the bit lines and input/output (I/O) lines and controlled by a column select line or signal. In one embodiment, a first transfer gate is connected between the bit lines and a second transfer gate, the second transfer gate connected between the first transfer gate and an input/output (I/O) line and controlled by a column select line (CSL). A third transfer gate may also by provided. The first transfer gate is driven in response to a clock signal which is enabled at substantially the same time as a word line of the plurality of word lines is selected during both read and write cycles. Thus, during a write cycle in which the CAS signal is enabled prior to the RAS signal, a selected CSL can be increased from a first voltage (VSS) to one of a second voltage (Vdd) and {fraction (3/2)} Vdd as soon as a column address is input.
申请公布号 US6198687(B1) 申请公布日期 2001.03.06
申请号 US19960716884 申请日期 1996.09.20
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 SAKUI KOJI;OHUCHI KAZUNORI;MASUOKA FUJIO
分类号 G11C8/18;(IPC1-7):G11C11/407;G11C7/02 主分类号 G11C8/18
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