发明名称 Step coverage and overhang improvement by pedestal bias voltage modulation
摘要 The invention provides a method for depositing a metal film on a substrate, comprising generating a high density plasma in a chamber, sputtering metal particles from a target to the substrate, and applying a modulated radio frequency (RF) bias to the substrate during deposition. Another aspect of the invention provides an apparatus for depositing a metal film on a substrate comprising a high density plasma physical vapor deposition (HDP PVD) chamber and a controller to modulate a RF bias power applied to a substrate in the chamber.
申请公布号 US6197167(B1) 申请公布日期 2001.03.06
申请号 US19990416374 申请日期 1999.10.12
申请人 APPLIED MATERIALS, INC. 发明人 TANAKA YOICHIRO
分类号 C23C14/04;C23C14/06;C23C14/16;C23C14/34;C23C14/35;H01L21/285;H01L21/768;(IPC1-7):C23C14/34 主分类号 C23C14/04
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