发明名称 Process for determining the thickness of a layer of electroconductive material deposited on a body
摘要 A process for determining a thickness of a layer of electrically conductive material, any measurement errors are converted into dimensionless norm values with the aid of a normalization process. In this conversion, measurement errors, for example due to temperature drift and different electrical and magnetic properties of the base material of the carrying body can be largely eliminated. These norm values are converted into layer thickness values with the aid of a calibration curve.
申请公布号 US6198278(B1) 申请公布日期 2001.03.06
申请号 US19990125434 申请日期 1999.04.30
申请人 ROBERT BOSCH GMBH 发明人 DOBLER KLAUS;HACHTEL HANSJOERG;DIMKE REINHARD;HEIDE FRANZ AUF DER;BLATTERT RICHARD;WEBER JOSEF
分类号 G01B7/06;G01D5/20;G01N27/72;G01R33/12;(IPC1-7):G01B7/06 主分类号 G01B7/06
代理机构 代理人
主权项
地址