| 摘要 |
PROBLEM TO BE SOLVED: To detect a failure in a non-failure detecting block without examining the change of a first circuit connection information and a test pattern designed by a designer by correcting, adding circuit connection information from information of the non-failure detecting list of the results of failure simulation so as to add another test pattern to the test pattern. SOLUTION: A first test pattern for inspecting first circuit connection information designed by the designer is generated to execute failure simulation (101 to 103). A third circuit connection information is generated (104) by using first circuit connection information, prepared second circuit connection information and the non-failure detection list of the results of failure simulation. A third test pattern is generated (105) by using a first test pattern and a prepared second pattern and second failure simulation is executed (106) by using third circuit connection information and the third test pattern to detect at least one non- failure. |
