发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device is provided to improve an insulating characteristic of a dielectric layer and to increase capacitance of a capacitor structure, by forming the dielectric layer by an atomic layer deposition method when a polysilicon layer is used as a storage electrode, and by forming a plate electrode with a material layer of which a work function is higher than the storage electrode. CONSTITUTION: The first electrode(31) is composed of a silicon-based material. Reaction materials are sequentially supplied to the surface of the first electrode to form a dielectric layer(37). The second electrode(39) is formed on the dielectric layer, and a work function of the second electrode is higher than the first electrode composed of the silicon-based material.
申请公布号 KR20010017820(A) 申请公布日期 2001.03.05
申请号 KR19990033520 申请日期 1999.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, SEONG JE;JANG, YUN HUI;KIM, YEONG GWAN;LEE, JONG HO;LEE, JU WON;LEE, SANG IN;LEE, SEUNG HWAN;LIM, JAE SUN;PARK, HEUNG SU;PARK, YEONG UK
分类号 H01L29/43;H01L21/02;H01L21/28;H01L21/316;H01L21/318;H01L21/822;H01L21/8242;H01L21/8246;H01L27/04;H01L27/10;H01L27/105;H01L27/108;H01L29/423;H01L29/49;H01L29/51;(IPC1-7):H01L27/10 主分类号 H01L29/43
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