发明名称 METHOD FOR MANUFACTURING SOLID STATE IMAGE DEVICE
摘要 PURPOSE: A method for manufacturing a solid state image device is provided to maximumly broaden a charge transfer region and a photodiode region by making a surface of a substrate rough, and to prevent a smear phenomenon by blocking light toward a side of a metal light blocking layer. CONSTITUTION: A local oxide layer having a constant interval is formed on a semiconductor substrate(31). The local oxide layer is eliminated to make the surface of the semiconductor substrate rough. A well region(33) is formed in the rough surface of the semiconductor substrate. Channel stop ions are implanted into the well region to form a channel stop layer(34) for electrically separating respective regions. A charge transfer region(35) is formed in a portion where a channel stop region is not formed in the well region. A photodiode region(37) is formed in the well region between the charge transfer region. A poly gate(39) corresponding to the charge transfer region is formed on the semiconductor substrate by intervening a gate insulating layer(38).
申请公布号 KR20010018317(A) 申请公布日期 2001.03.05
申请号 KR19990034213 申请日期 1999.08.18
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 KIM, HYEON BYEONG;SIM, JIN SEOP
分类号 H01L27/148;(IPC1-7):H01L27/148 主分类号 H01L27/148
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