发明名称 Semiconductor image sensor used as a CMOS sensor comprises a semiconductor substrate, a photodiode, transistor, insulating layer and an optical layer
摘要 Semiconductor image sensor comprises a semiconductor substrate (210) which is divided into a light determining region and a periphery switching region; a photodiode (220) provided above the light determining region (212); at least one transistor (230) provided above the periphery switching region (214); at least one insulating layer (240) provided above the diode and the transistor; and an optical layer (270) on the insulating layer to efficiently transfer light to the photodiode. Preferred Features: The optical layer is made of tetraethoxyorthosilicate and is formed by PECVD process.
申请公布号 DE10031439(A1) 申请公布日期 2001.03.01
申请号 DE20001031439 申请日期 2000.06.28
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 PARK, KI-NAM
分类号 H01L27/14;G01J1/02;H01L27/146;H01L31/10;H04N5/335;H04N5/369;H04N5/374;(IPC1-7):H01L27/146 主分类号 H01L27/14
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