发明名称 SURFACE INSPECTION METHOD AND DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To rapidly and accurately detect and discriminate the defect contents of the surface of an object by a single inspecting device by simultaneously applying irradiation of yellow light in plane shape from a yellow light source and linear blue light from a blue light source, picking up the image of reflected light by a color camera with an RGB output function, and analyzing the image. SOLUTION: Light from a surface yellow light source A is applied to irradiate the surface of an inspected body E, with broadening surrounded by two dotted lines a1, a2. The mutual directions of the yellow light source A and a color camera C are so set that an incidence angle (t) of yellow light a2 toward a focus position (e) of the camera C coincides with an image pickup angle (v) of the camera C. The camera C also picks up the image of irregularly reflected yellow light c2. Light from a linear blue light source B is applied to irradiate the focus position (e), and the camera C picks up the image of only blue light irregularly reflected toward the camera C in the focus position (e) and traveling as shown by c1. RGB output from the camera C and further monochromatic luminance output from a monochromatic camera D if necessary are subjected to OR processing or the like to analyze the image.
申请公布号 JP2001056297(A) 申请公布日期 2001.02.27
申请号 JP19990230842 申请日期 1999.08.17
申请人 ELECTRO TECHNO KK 发明人 WATANABE YOSHIHARU;FUJITOMO HISANORI;KATAISHI EIICHI;MIURA TAKAHIRO;SUZUKI SATOSHI
分类号 G01N21/892;(IPC1-7):G01N21/892 主分类号 G01N21/892
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