| 摘要 |
PURPOSE: Disclosed is an equipment for inspecting a liquid crystal driver LSI with high accuracy while reducing the rest time significantly. CONSTITUTION: The inspection equipment inspects a liquid crystal driver LSI(1) arranged such that the output voltages from a plurality of DA converters(2-1) are delivered from corresponding output terminals(3-1,...,) respectively. A voltage measuring unit(5) measures a plurality of gradation voltages delivered from the first output terminal(3-1) and calculates the differential voltage between each measured voltage and a corresponding expected voltage value. A differential amplifier(6-1,...) has one input terminal receiving the output voltage from each output terminal(3-2,...) other than the first output terminal and the other input terminal receiving the output voltage from the first output terminal. A comparator(7) receives the amplified differential voltage from a plurality of differential amplifiers and makes a decision whether the amplified differential voltage from each differential amplifier falls within a specified voltage range or not.
|
