发明名称 Wafer storing system having vessel coated with ozone-proof material and method of storing semiconductor wafer
摘要 A gate oxide layer grown on a semiconductor wafer is liable to be contaminated by organic compound particles in a clean room between the growth of the oxide and the next deposition step, and the semiconductor wafer is sealed in ozonic ambience in a vessel coated with an inner wall of ozone-proof material such as chromium oxide so that the ozone decomposes the organic compound particles without producing new particles.
申请公布号 US6191051(B1) 申请公布日期 2001.02.20
申请号 US19990270882 申请日期 1999.03.17
申请人 NEC CORPORATION 发明人 SHIMIZU YUJI
分类号 H01L21/673;H01L21/00;H01L21/336;H01L29/78;(IPC1-7):H01L21/31 主分类号 H01L21/673
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