发明名称 METHOD FOR MEASURING CARBON CONCENTRATION OF SEMICONDUCTOR CRYSTAL
摘要 <p>PROBLEM TO BE SOLVED: To reduce an influence of a noise component and to manifest an absorption of a carbon by measuring a carbon concentration in a state such that a filter for shutting OFF a light having a specific wave number is provided before a photodetector. SOLUTION: A filter for shutting OFF a light having a wavelength of 1,000 cm-1 or more is installed before a photodetector in a background spectrum of a Fourier transform type infrared spectral altitude meter (FTIF) for a GaAs single crystal to be an object, a carbon concentration is measured, and an absorption distributed state is obtained. A region A of 1,000 cm-1 or more indicated by a shaded region in the drawing is shut OFF, and the light is incident only to a part of a region B. This incident light amount is remarkably small as compared with that of the case that the overall region of the wave number is an object, and an allowance takes places in the received capacity of the photodetector. Accordingly, when a diaphragm is opened in this state, a light amount of the region B near 580 cm-1 necessary to measure the carbon concentration can be increased. As a result, the absorption near the 580 cm-1 can be manifested, and the concentration can be measured by less number of integrations.</p>
申请公布号 JP2001041885(A) 申请公布日期 2001.02.16
申请号 JP19990218098 申请日期 1999.07.30
申请人 HITACHI CABLE LTD 发明人 HIROOKA CHIHIRO;NAKAZONO RYUICHI
分类号 G01J3/45;G01N21/35;G01N21/3563;G01N27/414 主分类号 G01J3/45
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