发明名称 |
APPARATUS FOR INSPECTING DIODE SENSOR OF MICROWAVE OVEN |
摘要 |
PURPOSE: A diode sensor inspection apparatus is provided to detect the defectiveness of a diode sensor by inspecting the diode sensor of a microwave oven with a simple inspection key. CONSTITUTION: A diode sensor inspection apparatus is composed of a microwave sensing unit detecting microwave in a waveguide with a diode sensor(D); an inspection key outputting an inspection signal in a microwave oven; and a microcomputer(135) outputting a test signal by inputting the inspection signal and showing a message on a display unit according to the voltage detected by inputting the test signal and the output from the diode sensor. The defectiveness of the diode sensor is detected by no detection of voltage at the short of the diode sensor. A diode sensor inspection apparatus inspects the diode sensor of the inoperative microwave oven simply.
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申请公布号 |
KR20010011408(A) |
申请公布日期 |
2001.02.15 |
申请号 |
KR19990030778 |
申请日期 |
1999.07.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HA, JAE GI |
分类号 |
F24C7/00;(IPC1-7):F24C7/00 |
主分类号 |
F24C7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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