发明名称 APPARATUS FOR INSPECTING DIODE SENSOR OF MICROWAVE OVEN
摘要 PURPOSE: A diode sensor inspection apparatus is provided to detect the defectiveness of a diode sensor by inspecting the diode sensor of a microwave oven with a simple inspection key. CONSTITUTION: A diode sensor inspection apparatus is composed of a microwave sensing unit detecting microwave in a waveguide with a diode sensor(D); an inspection key outputting an inspection signal in a microwave oven; and a microcomputer(135) outputting a test signal by inputting the inspection signal and showing a message on a display unit according to the voltage detected by inputting the test signal and the output from the diode sensor. The defectiveness of the diode sensor is detected by no detection of voltage at the short of the diode sensor. A diode sensor inspection apparatus inspects the diode sensor of the inoperative microwave oven simply.
申请公布号 KR20010011408(A) 申请公布日期 2001.02.15
申请号 KR19990030778 申请日期 1999.07.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HA, JAE GI
分类号 F24C7/00;(IPC1-7):F24C7/00 主分类号 F24C7/00
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