| 摘要 |
PROBLEM TO BE SOLVED: To provide an insert excellent in holding property of an electronic component to be tested. SOLUTION: This insert 16 is provided with a latch part 163a which moves between a position where holding is performed covering the upper surface of an electronic component IC to be tested which is accommodated in the insert 16 and a position where retreating is performed from the upper surface of the electronic component, and a latch arm part 163d which rotatably supports the latch part 163a on an insert main body 161. A tip part of the latch part 163a and a rotation center 163b of the latch arm part 163d are arranged on almost the same vertical line when these are viewed from a side surface of the insert 16. The latch part 163a and the rotation center of the latch arm part 163d are offset when viewed from a plane of the insert 16.
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