发明名称 OPTICAL SUB-PIXEL PARTS INSPECTION SYSTEM
摘要 An inspection system (10) for evaluating workpieces for conformance to configuration criteria including a track (16) for causing workpieces (22) to translate through a test section (18), the test section (18) including a light source (40) for production of a uniform sheet of light (44), the light source (40) oriented with respect to the track (16) such that the workpieces (22) occlude the uniform sheet of light (44) upon passing through the test section (18), the test section (18) further having a video system (40, 42) for receiving the occluded uniform sheet of light (44), providing output signals related to the intensity of the occluded uniform sheet of light (44) incident on the video system (40, 42), and a signal processing means (64) for receiving the output signals.
申请公布号 WO0109564(A1) 申请公布日期 2001.02.08
申请号 WO2000US20947 申请日期 2000.08.01
申请人 MECTRON ENGINEERING COMPANY;HANNA, JAMES, L. 发明人 HANNA, JAMES, L.
分类号 G01B11/24;G01B11/245;G01N21/952;(IPC1-7):G01B11/04 主分类号 G01B11/24
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