发明名称 Method and apparatus for breaking and separating a wafer into die using a multi-radii dome
摘要 A method and apparatus (10) for breaking a wafer (24) into die (26) having a high aspect ratio. In one embodiment, a multi-radii dome (12) is utilized to controllably break the wafer in two directions. The two different dome curvatures (R1, R2) provide an even, controlled, force along the kerfs in both the X-direction and the Y-direction. In another embodiment, a cylindrical dome (80) being curved (R3) in the Y-direction and flat in the X-direction is used to break a wafer into die having exceptionally high aspect ratios. The present invention reduces the likelihood of die fracture in the long dimension during the wafer break process. The wafer (24) is mounted on stretchable wafer tape (18) during the break process to prevent the die edges from contacting and rubbing with one another after the break process. The present invention allows separation of die of exceptionally large aspect ratios such as those having a 1:25 aspect ratio.
申请公布号 US6184063(B1) 申请公布日期 2001.02.06
申请号 US19970975378 申请日期 1997.11.20
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 MCKENNA ROBERT G.;CROFF R. SCOTT;TOM EDWIN L.
分类号 H01L21/301;H01L21/304;H01L21/78;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 H01L21/301
代理机构 代理人
主权项
地址