发明名称 Wide field of view and high speed scanning microscopy
摘要 Wide angle, limited rotation, on-axis scanning with a micro lens that preferably is aspheric. Predetermined defocusing of some wavelengths relative to others in opposite sense to chromatic aberration of a micro lens, enable focus by the micro lens of multiple wavelengths on the same point. Data collection in a rotary, on-axis scanner is controlled by detecting the actual position of the rotating structure. Scan efficiency of an on-axis limited rotation lens is improved by coordinated deflection of the light path to different portions of the lens. A flexure-mounted dither mirror effectively makes this correction. Interpolation of arcuate scan data to a raster pattern is achieved by timing the data sampling to correspond with rows of the raster pattern; averaging the straddling data points in the column results in fast, economical interpolation. High speed, limited rotation scanning microscopes operating in transmission and reflectance modes are described, as well as very efficient fluorescence readers. Novel microscope processes use features provided by the instruments described.
申请公布号 US6185030(B1) 申请公布日期 2001.02.06
申请号 US19980170847 申请日期 1998.10.13
申请人 OVERBECK JAMES W. 发明人 OVERBECK JAMES W.
分类号 B01L3/02;C40B60/14;G01N21/64;G01N35/10;G02B21/00;G02B21/06;G02B21/16;G02B21/26;G02B21/34;G02B21/36;G02B26/10;(IPC1-7):G02B26/08;G01N23/04 主分类号 B01L3/02
代理机构 代理人
主权项
地址