发明名称 METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To suppress emission of global warming gases in a dry etching process. SOLUTION: In this semiconductor device, a solid 211 containing fluorine element and carbon element as main components is excited to generate a fluorocarbon gas in a region, separate from a reaction chamber housing a substrate 201 to be treated. The fluorocarbon gas is decomposed into F, CO, CO2, COF, COF2 and so forth by a plasma 210 of a gas containing am oxygen element, generated between the solid excited region and the reaction chamber and introduced into a treatment vessel 202.
申请公布号 JP2001028362(A) 申请公布日期 2001.01.30
申请号 JP19990201490 申请日期 1999.07.15
申请人 TOSHIBA CORP 发明人 NISHINO HIROTAKE
分类号 H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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