发明名称 SIGNAL PROCESSOR AND SEMICONDUCTOR DEVICE TEST UNIT USING THE SIGNAL PROCESSOR
摘要 PROBLEM TO BE SOLVED: To increase the sampling frequency of aΣΔmodulator or the like for over-sampling. SOLUTION: A signal processor 20 includes a frequency compensation unit 28 and a modulation unit 30. The unit 28 includes 1st and 2nd waveform shapers 22, 52. The unit 30 is formed by two-way interleaving of the primaryΣΔmodulators. Each of twoΣΔmodulators processes one of the even code string Xk (k: an even number) and odd code string Xk (k: an odd number) of an input signal X. The unit 28 controls transmission characteristics so that the quantization noise is correctly sampled at the reference frequency fs of the whole device by using theΣΔmodulators.
申请公布号 JP2001024512(A) 申请公布日期 2001.01.26
申请号 JP19990191460 申请日期 1999.07.06
申请人 ADVANTEST CORP 发明人 ASAMI KOJI
分类号 H03M3/04;(IPC1-7):H03M3/04 主分类号 H03M3/04
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