发明名称 TEST DATA GENERATION SYSTEM AND METHOD THEREFOR AND RECORD MEDIUM RECORDING TEST DATA GENERATION PROGRAM
摘要 PROBLEM TO BE SOLVED: To make executable a high-speed operation (actual operation) test of LSI on a tester by converting simulation data into high-speed operation verification test data being composed so that a specific output expectation value can be acquired after stopping a clock signal for a specific period. SOLUTION: In the test data generation system 4, a simulation data file 1 and a condition data file 2 are inputted, a series of processing is made based on control by a CPU 5, and high-speed operation verification test data 3 is outputted. Also, in the test data generation system 4, it is possible to talk with a designer by a display (screen) 6. Also, in this system, data may be recorded, as a program, on such a record medium as a semiconductor memory (RAM, ROM), a floppy disk(FD), a hard disk(HD), an optical disk (CD, DVD), a magnetooptical disk (MO, MD), and a magnetic tape.
申请公布号 JP2001021624(A) 申请公布日期 2001.01.26
申请号 JP19990193707 申请日期 1999.07.07
申请人 FUJITSU LTD 发明人 WATANABE HITOSHI
分类号 G01R31/3183;G01R31/28;G01R31/319;G06F11/22 主分类号 G01R31/3183
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