发明名称 CHEMICAL MECHANICAL POLISHING HEAD HAVING FLOATING WAFER RETAINING RING AND WAFER CARRIER WITH MULTI-ZONE POLISHING PRESSURE CONTROL
摘要 <p>In one aspect the invention provides a polishing apparatus (101) including a housing (120) a carrier (160) for mounting a substrate (113) to be polished, a retaining ring (134) circumscribing the carrier (113) for retaining the substrate (113), a first coupling (162) attaching the retaining ring (134) to the carrier (160) such that the retaining ring (134) may move relative to the carrier (160), a second coupling (145) attaching the carrier (160) to the housing (120) the housing (120) and the first coupling (162) defining a first pressure chamber (131) to exert a pressure force against the retaining ring (134), and the housing (120) and the second coupling (145) defining a second pressure chamber (132) to exert a pressure force against the subcarrier (160). In one embodiment, the couplings are diaphragms. In another embodiment, the invention includes a single- or multiple-chambered wafer carrier or subcarrier capable of modifying a differential polishing pressure across the surface of the wafer or other substrate.</p>
申请公布号 WO0054933(A3) 申请公布日期 2001.01.25
申请号 WO2000IB00508 申请日期 2000.02.24
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 WANG, HUEY-MING;MOLONEY, GERARD, S.;CHIN, SCOTT;GERAGHTY, JOHN, J.;DYSON, WILLIAM, JR.;DICKEY, TANLIN, K.
分类号 B24B37/30;B24B37/32;B24B41/06;B24B49/16;H01L21/304;(IPC1-7):B24B37/04;B24B53/007 主分类号 B24B37/30
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