| 摘要 |
PROBLEM TO BE SOLVED: To simplify a configuration by adding a slight configuration to a cycle generation part for standards and a delay generation part for standards for adding a free run generation function for generating a free run clock. SOLUTION: At a cycle generation part with a free run function (cycle generation part) 11", a free run start/stop control part (control part) is provided in a front stage at the cycle generation part for standards. Even when either of a gate signal for a free run clock being generated by the control part or the gate signal from a pattern generator 112 rises to an H logic, the cycle generation part for standards starts the generation of a synchronous signal by an OR gate. In a delay generation part with the free run function (delay generation part) 12", a register for setting the generation of the free run clock is provided. When an IC test where the free run clock needs to be generated is to be carried out, the H logic is set to the register of the delay generation part 12" for requiring the generation of the free run clock, and an L logic is set to other registers of the delay generation part 12".
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