发明名称 MICROCOMPUTER AND ITS TEST METHOD AND TEST CIRCUIT
摘要 PROBLEM TO BE SOLVED: To make establishabel a test of a small number of pins which can effectively input the instructions by means of an external test LSI and an internal data receiving circuit of a one-chip microcomputer. SOLUTION: When the instructions which are already stored in the instruction storing registers 22-24 are inputted to an instruction input register 21, the instructions stored in the instruction store registers 32-34 are used again. When an instruction other than those stored in the registers 22-24 is inputted to the register 21, this inputted instruction is serially transferred and used.
申请公布号 JP2001014294(A) 申请公布日期 2001.01.19
申请号 JP19990182877 申请日期 1999.06.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KONDO HIDEJI
分类号 G06F11/22;G06F15/78 主分类号 G06F11/22
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