Methode and device for flaw detection in metalic parts

摘要

Procedure in which pulsed high frequency magnetic fields are coupled to the test component using a core-free coil (3) and a high-frequency generator (4). The resulting Eddy currents generate heat in the test piece which is conducted through the test piece and can be measured as a temperature increase. Defects within the test piece (1) reduce Eddy currents and decrease the temperature rise. An Independent claim is made for a device for detection of defects within test pieces using a high frequency pulsed magnetic field.