APPARATUS AND METHOD FOR TESTING SINGLE CHIP IN PARALLEL

摘要

PURPOSE: An apparatus for testing a single chip in parallel is provided to test defect of a single chip having plural function blocks parallel in real time simply through the limited number of output pins. CONSTITUTION: An apparatus for testing a single chip(10) examines abnormality of the single chip having plural function blocks generating the same output signals. A comparator compares if each level of the output signals are the same. A transmitter(18) transmits one of the output signals out of the single chip by responding to the compared result. A defect discriminator(22) generates a test discrimination result for deciding the defect of the single chip by responding to the level of the output signal outputted from the transmitter.