发明名称 MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a measuring device capable of avoiding voltage application which exceeds the breakdown voltage of the voltage axis input terminal of an osilloscope even if a thyristor an element-to-be-measured, is a defective part, thereby preventing the breakdown of the voltage axis input circuit of an oscillaoscope. SOLUTION: This measuring device is provided with a voltage source 1, a load resistor 2, a thyristor 3, a trigger circuit 4, a delay circuit 5, a control circuit 6, a driving circuit 10, a switch 11, a current detector 12, a current- voltage converting circuit 13, add an osilloscope 14. The control circuit 6 involves a comparator 7, a reference voltage sourca 8, and an AND gate 9. Therefore, in measuring transient characteristics by applying high voltage to an element-to-be-measured, it is possible to prevent the destruction of the voltage axis input circuit of the osilloscope 14 due to excessive voltage even in case that the element-to-be-measured is defective while ensuring measurement accuracy. It is also possible to form a measuring device at a low cost because an general purpose-osilloscope can be connected directly to the element-to-be- measured.
申请公布号 JP2001004670(A) 申请公布日期 2001.01.12
申请号 JP19990171249 申请日期 1999.06.17
申请人 NEC CORP 发明人 SUZUKI FUSAO
分类号 G01R13/32;(IPC1-7):G01R13/32 主分类号 G01R13/32
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