| 摘要 |
PROBLEM TO BE SOLVED: To obtain a measuring jig which is continuity-connected easily to an electric double layer capacitor and which restrains an irregularity in the contact resistance of a connection part. SOLUTION: Each of respective probes 10 to 15 has a structure in which a probe pin 33 is force-fitted into a receptacle 31 via a spring 32, and the probe pin 33 is urged to the downward direction so as to be freely moved in the vertical direction. This electric double layer capacitor 2 is placed on a bottom plate 3 so as to be tilted, and it is erected while being brought into contact with a second guide groove 6, when the electric double layer capacitor 2 is erected completely, a positive electrode 16 and the probe pin 18 of a first charging and discharging probe 10, the positive electrode 16 and the probe pin 20 of a first voltage measuring probe 14, a negative electrode 17 and the probe pin 19 of a second charging and discharging probe 11 as well as the negative electrode 17 and the probe pin 21 of a second voltage measuring probe 15 are brought into contact with each other under respective desired pressures so as to be set to continuity. |
